Whole-pattern methods
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.6,
pp. 496-496
[ doi:10.1107/97809553602060000596 ]
are often required.
References
Langford,
J.
I., Louër, D., Sonneveld, E. J. & Visser, J. W. (1986). Applications of total pattern fitting to a study of crystallite size and strain in powder zinc oxide. Powder Diffr. 1, 211–221 ...
Errors of the Bragg angle
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.1.3,
pp. 491-491
[ doi:10.1107/97809553602060000596 ]
[
more
results from section 5.2.1 in volume C]
Errors and uncertainties in wavelength
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.2.1,
pp. 492-492
[ doi:10.1107/97809553602060000596 ]
[
more
results from section 5.2.2 in volume C]
Factors determining accuracy
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.13,
pp. 501-504
[ doi:10.1107/97809553602060000596 ]
Angle-dispersive diffractometer methods: conventional sources
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.4,
pp. 495-495
[ doi:10.1107/97809553602060000596 ]
Extrapolation, graphical and analytical
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.3.2,
pp. 493-494
[ doi:10.1107/97809553602060000596 ]
of a `round-robin' exercise comparing the output of computer programs for lattice-parameter refinement and calculations. British Crystallographic Association. Google Scholar
Langford,
J.
I. & Wilson, A. J. C. (1962). Counter diffractometer ...
[
more
results from section 5.2.3 in volume C]
Energy-dispersive techniques
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.7,
pp. 496-497
[ doi:10.1107/97809553602060000596 ]
Scholar
Langford,
J.
I. & Wilson, A. J. C. (1962). Counter diffractometer: the effect of specimen transparency on the intensity, position and breadth of X-ray powder diffraction lines. J. Sci. Instrum. 39, 581–585. Google Scholar ...
Angle-dispersive diffractometer methods: synchrotron sources
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.5,
pp. 495-496
[ doi:10.1107/97809553602060000596 ]
Intensity standards
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.11,
pp. 500-500
[ doi:10.1107/97809553602060000596 ]
Camera methods
Parrish, W.,
Wilson, A. J. C. and
Langford, J. I.,
International Tables for Crystallography
(2006).
Vol. C,
Section 5.2.8,
pp. 497-498
[ doi:10.1107/97809553602060000596 ]
References
Langford,
J.
I., Pike, E. R. & Beu, K. E. (1964). Precise and accurate lattice parameters by film powder methods. IV. Theoretical calculation of axial (vertical) divergence profiles, centroid shifts, and variances for cylindrical powder ...
